High-resolution Atomic Force Microscope for PPMS®

High-resolution Atomic Force Microscope für PPMS

 

This high-resolution AFM (Atomic Force Microscope) of less than 25 mm diameter was designed to fit perfectly into the PPMS® (Physical Property Measurement System) of Quantum Design. It offers all common measurement modes, such as contact mode and intermittent contact mode, plus the PLL-controlled true non-contact mode and high-resolution MFM mode. Joining the AFM with the PPMS® provides the researcher with a versatile nanoscale imaging tool in a variable temperature and variable magnetic field environment. The broad temperature range of 4–400 K and the available magnetic field options of up to 16 T promise exciting new studies on phase transitions, superconductors, magnetic thin films, 2DEG, etc.

Download data sheet (PDF file, 444 KB)