NanoScan Ltd
Ueberlandstrasse 129
CH-8600 Duebendorf
Switzerland
+41 43 931 02 40
info@nanoscan.ch
Journals
Microstructural and magnetic properties of themally mixed Ni/Si bilayers
K. Zhang, K.P. Lieb, N. Bibic, N. Pilet, T.V. Ashworth, M.A. Marioni, H.J. Hug
J. Phys. D: Appl. Phys. 41 (2008)
Ion-induced magnetic texturing of Ni films: Domain structure and strain
K. Zhang, K.P. Lieb, D.G. Merkel, M. Uhrmacher, N. Pilet, T.V. Ashworth, H.J. Hug
Nuclear Instruments and Methods in Physics Research B 257 (2007) 379-382
Perpendicular magnetic recording technology at 230 GBit/in2
A. Moser, C. Bonhote, Q. Dai, H. Do, B. Knigge, Y. Ikeda, Q. Le, B. Lengsfield, S. MacDonald, J. Li, V. Nayak, R. Payne, M. Schabes, N. Smith, K. Takano, C. Tsang, P. van der Heijden, W. Weresin, M. Williams, and M. Xiao
Journal of Magnetism and Magnetic Materials 303, 271-275 (2006)
High-resolution magnetic force microscopy study of high-density transitions in perpendicular recording media
A. Moser, M. Xiao, P. Kappenberger, K. Takano, W. Weresin, Y. Ikeda, H. Do, H.J. Hug
Journal of Magnetism and Magnetic Materials 287, 298-302 (2005)
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